The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 12, 2024
Filed:
Apr. 29, 2022
Orbbec Inc., Guangdong, CN;
Orbbec Inc., Shenzhen, CN;
Abstract
An optical information detection method includes: acquiring a first image captured by a first imaging device, wherein the first image comprises a target full-field projection pattern; extracting features from the first image to obtain first feature information; acquiring second feature information and first graphic information of a reference full-field projection pattern, wherein the first graphic information comprises zero-order information and/or secondary information; calculating a first mapping relationship between the first feature information and the second feature information; mapping the first graphic information to the target full-field projection pattern according to the first mapping relationship, to obtain second graphic information corresponding to the target full-field projection pattern; and calculating target optical information according to the second graphic information. The above-mentioned method is compatible with cases in which, regardless of whether a zero-order speckle pattern is globally unique or not, optical information can be accurately detected.