The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 12, 2024

Filed:

Sep. 13, 2019
Applicant:

Siemens Aktiengesellschaft, Munich, DE;

Inventors:

Yonatan Hyatt, Tel-Aviv, IL;

Alexander Spivak, Hadera, IL;

Katherina Shefer, Tel-Aviv, IL;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01); G06F 18/40 (2023.01); G06V 10/22 (2022.01); G06V 10/46 (2022.01); G06V 10/94 (2022.01);
U.S. Cl.
CPC ...
G06T 7/001 (2013.01); G06F 18/40 (2023.01); G06V 10/235 (2022.01); G06V 10/46 (2022.01); G06V 10/945 (2022.01);
Abstract

Embodiments of the invention provide automatic detection of same-type objects on an inspection line and automatically capture and/or display an image of the object once it is detected. Additionally, embodiments of the invention automatically provide the outline of an object to a user, enabling the user to either confirm or easily correct the outline. The confirmed or corrected outline is then automatically applied to all images of inspected items of the same-type, allowing optimization of inspection tasks such as defect detection, for all inspected items, based on a short, possibly a one-time, input, from the user.


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