The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 12, 2024

Filed:

Sep. 30, 2022
Applicant:

Adobe Inc., San Jose, CA (US);

Inventors:

Akhilesh Kumar, San Jose, CA (US);

Zhe Lin, Fremont, WA (US);

William Lawrence Marino, Hockessin, DE (US);

Assignee:

Adobe Inc., San Jose, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06N 3/08 (2023.01); G06N 5/04 (2023.01); G06T 7/00 (2017.01);
U.S. Cl.
CPC ...
G06T 7/0002 (2013.01); G06N 3/08 (2013.01); G06N 5/04 (2013.01); G06T 2207/20081 (2013.01);
Abstract

Embodiments of the present invention provide systems, methods, and computer storage media for detecting and classifying an exposure defect in an image using neural networks trained via a limited amount of labeled training images. An image may be applied to a first neural network to determine whether the images includes an exposure defect. Detected defective image may be applied to a second neural network to determine an exposure defect classification for the image. The exposure defect classification can includes severe underexposure, medium underexposure, mild underexposure, mild overexposure, medium overexposure, severe overexposure, and/or the like. The image may be presented to a user along with the exposure defect classification.


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