The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 12, 2024
Filed:
Jan. 29, 2024
Shanghai Jiao Tong University, Shanghai, CN;
Wenrui Dai, Shanghai, CN;
Yangmei Shen, Shanghai, CN;
Chenglin Li, Shanghai, CN;
Junni Zou, Shanghai, CN;
Hongkai Xiong, Shanghai, CN;
SHANGHAI JIAO TONG UNIVERSITY, Shanghai, CN;
Abstract
A three-dimensional point cloud upsampling method includes: dividing a three-dimensional point cloud into overlappable point cloud blocks which have a fixed number of points and are capable of covering all the points; extracting hierarchical features according to point coordinates in the point cloud blocks; achieving point set feature expansion of the extracted hierarchical features by using multi-scale heat kernel graph convolution; and reconstructing point coordinates in an upsampled three-dimensional point cloud from the expanded features. According to the present disclosure, detail information enhancement with different fine granularities can be performed on the three-dimensional point cloud which is sparse and nonuniformly distributed in the space, and at the same time, good stability is provided for overcoming potential noise disturbance and local deformation. The method can promote the uniformity of spatial distribution of the upsampled dense point cloud, and ensure the accurate representation for a geometric structure of a target object.