The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 12, 2024

Filed:

Feb. 23, 2024
Applicant:

Siemens Medical Solutions Usa, Inc., Malvern, PA (US);

Inventors:

Vladimir Panin, Knoxville, TN (US);

Mehmet Aykac, Knoxville, TN (US);

Shikui Yan, Knoxville, TN (US);

Brian Kelly, Knoxville, TN (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 11/00 (2006.01); A61B 6/03 (2006.01); G16H 30/40 (2018.01);
U.S. Cl.
CPC ...
G06T 11/003 (2013.01); A61B 6/037 (2013.01); G06T 11/006 (2013.01); G16H 30/40 (2018.01);
Abstract

An improved method for time alignment (TA) procedure and crystal efficiency (CE) normalization estimation procedure for a PET scanner system is disclosed. In the TA procedure modeled time-of-flight (TOF) data are compared against the measured TOF data from an axially short cylinder phantom in order to find individual detector's time offsets (TOs). Then the TOs are estimated simultaneously by matching the TOF center of mass between the modeled and measured TOF data. In the CE estimation, TOF reconstruction of CBM data on the axially short cylinder phantom is performed. Alternating between TOF image reconstruction and CE updates eventually lead to the correct estimation of activity and CE component.


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