The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 12, 2024

Filed:

Aug. 25, 2023
Applicant:

Block, Inc., Oakland, CA (US);

Inventors:

Kamran Sharifi, Toronto, CA;

Jeremy Wade, San Francisco, CA (US);

Bertram Leesti, Toronto, CA;

Afshin Rezayee, Richmond Hill, CA;

Yue Yang, Thornhill, CA;

Max Joseph Guise, San Francisco, CA (US);

Assignee:

Block, Inc., Oakland, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H04L 29/06 (2006.01); G06Q 20/32 (2012.01); G06Q 20/34 (2012.01); G07F 7/08 (2006.01); G07F 7/10 (2006.01); H04L 9/08 (2006.01); H04L 9/32 (2006.01);
U.S. Cl.
CPC ...
G06Q 20/341 (2013.01); G06Q 20/3226 (2013.01); G06Q 20/3278 (2013.01); G07F 7/0873 (2013.01); G07F 7/1016 (2013.01); H04L 9/0866 (2013.01); H04L 9/3278 (2013.01); H04L 2209/56 (2013.01); H04L 2209/805 (2013.01);
Abstract

An electronic device may include a printed circuit board having a physically unclonable function (PUF) source. The electronic device may also include processing circuitry positioned on the printed circuit board. The PUF source includes a plurality of traces and each trace includes a first portion and a second portion having an increased surface area relative to the first portion. The PUF source is responsive to an input from the processing circuitry to provide PUF data based on the impedance characteristics of the plurality of traces. The processing circuitry is further configured to process the PUF data from the PUF source to perform an operation within the device.


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