The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 12, 2024

Filed:

May. 11, 2020
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Jitendra Singh, Noida, IN;

Mukul Tewari, Lafayette, CO (US);

Kuntal Dey, Vasant Kunj, IN;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06Q 10/0635 (2023.01); A01B 79/00 (2006.01); G06N 20/00 (2019.01); G06Q 30/0204 (2023.01); G06Q 30/0601 (2023.01); G06Q 50/02 (2012.01); G06T 11/00 (2006.01); G06V 20/10 (2022.01);
U.S. Cl.
CPC ...
G06Q 10/0635 (2013.01); A01B 79/005 (2013.01); G06N 20/00 (2019.01); G06Q 30/0205 (2013.01); G06Q 30/0631 (2013.01); G06Q 50/02 (2013.01); G06T 11/001 (2013.01); G06V 20/188 (2022.01); G06T 2200/24 (2013.01);
Abstract

Method, apparatus, and computer program product are provided for estimating crop pest risk and/or crop disease risk at sub-farm level. In some embodiments, a farm region is determined based on farm definition data, and input data associated with the farm region are retrieved from a plurality of data sources. The input data may include a plurality of pixel sets. In some embodiments, for each pixel set, crop risk data are determined based on the input data using one or more spatiotemporal regression models. The crop risk data may include an estimate of crop pest risk and/or crop disease risk for each pixel set. In some embodiments, the farm region is categorized into a plurality of sub-farms each defining a risk level category for that sub-farm based on the crop risk data. In some embodiments, the sub-farms are displayed as a visual heat-map, along with recommended antidote options.


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