The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 12, 2024

Filed:

Apr. 18, 2023
Applicant:

Entefy Inc., Palo Alto, CA (US);

Inventor:

Alston Ghafourifar, Los Altos Hills, CA (US);

Assignee:

Entefy Inc., Palo Alto, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 9/46 (2006.01); G06F 9/48 (2006.01); G06F 9/50 (2006.01); H04L 47/70 (2022.01); G06N 3/02 (2006.01); G06T 1/20 (2006.01);
U.S. Cl.
CPC ...
G06F 9/5077 (2013.01); G06F 9/48 (2013.01); G06F 9/5005 (2013.01); H04L 47/82 (2013.01); G06F 2209/501 (2013.01); G06N 3/02 (2013.01); G06T 1/20 (2013.01);
Abstract

Disclosed are systems, methods, and computer readable media for automatically assessing and allocating virtualized resources (such as central processing unit (CPU) and graphics processing unit (GPU) resources). In some embodiments, this method involves a computing infrastructure receiving a request to perform a workload, determining one or more workflows for performing the workload, selecting a virtualized resource, from a plurality of virtualized resources, wherein the virtualized resource is associated with a hardware configuration, and wherein selecting the virtualized resources is based on a suitability score determined based on benchmark scores of the one or more workflows on the hardware configuration, scheduling performance of at least part of the workload on the selected virtualized resource, and outputting results of the at least part of the workload.


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