The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 12, 2024
Filed:
Feb. 14, 2023
Beekeeperai, Inc., Austin, TX (US);
Mary Elizabeth Chalk, Austin, TX (US);
Robert Derward Rogers, Oakland, CA (US);
BeeKeeperAI, Inc., Austin, TX (US);
Abstract
Systems and methods for the quantification of sample set quality is provided. In some embodiments, a sample dataset and a sample vector set are received. A rule-based screening of the sample dataset is applied to generate a heuristic quality score. Additionally, a sample vector set is generated from the sample dataset. The difference between the sample vector set and the example vector set is calculated to generate a degree of difference quality score. The heuristic quality score and the degree of difference quality score are normalized and then combined into a quality metric. Calculating the difference between the sample vector set and the example vector set is by framing the distance as a p-value in a hypothesis test, compared against a threshold.