The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 12, 2024

Filed:

Aug. 29, 2019
Applicant:

Nec Corporation, Tokyo, JP;

Inventors:

Takayuki Sasaki, Tokyo, JP;

Yusuke Shimada, Tokyo, JP;

Assignee:

NEC Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 21/54 (2013.01); G06F 21/55 (2013.01);
U.S. Cl.
CPC ...
G06F 21/556 (2013.01); G06F 21/54 (2013.01); G06F 21/552 (2013.01); G06F 21/554 (2013.01);
Abstract

In a backdoor inspection apparatus, a static analysis unit executes static analysis processing for a backdoor on each code block included in target software to be inspected to thereby specify a first code block and a condition, the first code possibly being the backdoor and the first code block being executed under the condition. Next, the static analysis unit outputs the target software to which first information indicating the specified first code block is added and second information indicating the specified condition to a dynamic analysis unit. The dynamic analysis unit controls dynamic analysis processing for the backdoor performed on the target software to which the first information is added based on the first information and the second information.


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