The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 12, 2024
Filed:
Nov. 24, 2023
Teradata Us, Inc, San Diego, CA (US);
Sung Jin Kim, Buena Park, CA (US);
Yinuo Zhang, Los Angeles, CA (US);
Mohamed Mahmoud Hafez Mahmoud Abdelrahman, Torrance, CA (US);
Paul Geoffrey Brown, Concord, MA (US);
Teradata US, Inc., San Diego, CA (US);
Abstract
A database system enumerates one-column candidate referential integrities (1CRIs) from a plurality of input columns in one or more relations. The database system applies one or more disqualification tests to the 1CRIs to eliminate illegitimate 1CRIs resulting in a list of non-disqualified 1CRIs, wherein the disqualification tests are applied to an 1CRI being tested (hereinafter (A*,B*), A* representing a set of values of a referenced column or columns and B* representing a set of values of a referencing column or columns) until (A*,B*) is disqualified or until all of the disqualification tests have been executed and (A*,B*) has not been disqualified, in which case (A*,B*) is added to the list of non-disqualified 1CRIs, wherein each of the disqualification tests reduces the likelihood of incorrectly adding (A*,B*) to the list of non-disqualified 1CRIs.