The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 12, 2024

Filed:

Jul. 05, 2023
Applicant:

Renesas Electronics Corporation, Tokyo, JP;

Inventor:

Kazuaki Terashima, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 12/0831 (2016.01); G06F 13/28 (2006.01);
U.S. Cl.
CPC ...
G06F 12/0835 (2013.01); G06F 13/28 (2013.01);
Abstract

A second memory stores a plurality of input data sets DSi composed of a plurality of pieces of input data. N multiply-accumulate units are capable of performing parallel processings, and each performs a multiply-accumulate operation on any one of the plurality of weight parameter sets and any one of the plurality of input data sets. A second DMA controller transfers the input data set from the second memory to the n multiply-accumulate units. A measurement circuit measures a degree of matching/mismatching of logic levels among the plurality of pieces of input data contained in the input data set within the memory MEM, the sequence controller controls the number of parallel processings by the n multiply-accumulate units based on a measurement result by the measurement circuit.


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