The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 12, 2024
Filed:
May. 09, 2019
Applicant:
Nippon Telegraph and Telephone Corporation, Tokyo, JP;
Inventors:
Yu Adachi, Tokyo, JP;
Haruto Tanno, Tokyo, JP;
Toshiyuki Kurabayashi, Tokyo, JP;
Yu Yoshimura, Tokyo, JP;
Hiroyuki Kirinuki, Tokyo, JP;
Assignee:
NIPPON TELEGRAPH AND TELEPHONE CORPORATION, Tokyo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 11/36 (2006.01);
U.S. Cl.
CPC ...
G06F 11/3692 (2013.01); G06F 11/3684 (2013.01); G06F 11/3688 (2013.01);
Abstract
A test device includes a first determination unit that determines based on setting information set in advance whether each screen element of a first screen is a non-test target and an execution unit that automatically executes an operation with respect to the screen element determined not to be a non-test target by the first determination unit, whereby it is possible to exclude a part of elements related to a screen from test targets.