The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 12, 2024

Filed:

Jul. 14, 2021
Applicant:

Panasonic Intellectual Property Management Co., Ltd., Osaka, JP;

Inventors:

Hiroki Urabe, Osaka, JP;

Kentaro Nakai, Tokyo, JP;

Satoru Matsunaga, Osaka, JP;

Yoshiki Ohashi, Osaka, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 11/22 (2006.01); G10L 13/00 (2006.01); H04L 12/28 (2006.01);
U.S. Cl.
CPC ...
G06F 11/2221 (2013.01); G06F 11/2294 (2013.01); G10L 13/00 (2013.01); H04L 12/2816 (2013.01);
Abstract

An utterance test method for an utterance device, an utterance test server, an utterance test system, and a program perform an utterance test on a test device (). The utterance test system includes at least one utterance device () capable of uttering, a terminal device (), and an utterance test server (). The utterance test server () receives an utterance test start command from the terminal device (), sets at least one utterance device () to be a test device () as a target of an utterance test, sets test content of the utterance test, and causes the test device () to utter the test content.


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