The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 12, 2024
Filed:
Oct. 03, 2019
3m Innovative Properties Company, St. Paul, MN (US);
Brian E. Brooks, St. Paul, MN (US);
Gilles J. Benoit, Minneapolis, MN (US);
Peter O. Olson, Andover, MN (US);
Tyler W. Olson, Woodbury, MN (US);
Himanshu Nayar, St. Paul, MN (US);
Frederick J. Arsenault, Stillwater, MN (US);
Nicholas A. Johnson, Burnsville, MN (US);
Brett R. Hemes, Woodbury, MN (US);
Thomas J. Strey, River Falls, WI (US);
Jonathan B. Arthur, Hudson, WI (US);
Nathan J. Herbst, Woodbury, MN (US);
Aaron K. Nienaber, Lake Elmo, MN (US);
Sarah M. Mullins, St. Paul, MN (US);
Mark W. Orlando, Chesterfield Township, MI (US);
Cory D. Sauer, Star Prairie, WI (US);
Timothy J. Clemens, Hastings, MN (US);
Scott L. Barnett, Medina, MN (US);
Zachary M. Schaeffer, Maplewood, MN (US);
Patrick G. Zimmerman, Mendota Heights, MN (US);
Gregory P. Moriarty, Vadnais Heights, MN (US);
Jeffrey P. Adolf, Rochester, MN (US);
Steven P. Floeder, Shoreview, MN (US);
Andreas Backes, Kaarst, DE;
Peter J. Schneider, Neuss, DE;
Maureen A. Kavanagh, Marine on St. Croix, MN (US);
Glenn E. Casner, Woodbury, MN (US);
Miaoding Dai, Woodbury, MN (US);
Christopher M. Brown, Cottage Grove, MN (US);
Lori A. Sjolund, Stillwater, MN (US);
Jon A. Kirschhoffer, Stillwater, MN (US);
Carter C. Hughes, River Falls, WI (US);
3M Innovative Properties Company, St. Paul, MN (US);
Abstract
Methods, systems, and apparatus, including computer programs encoded on a computer storage medium, for optimizing a process of manufacturing a product. In one aspect, the method comprises repeatedly performing the following: i) selecting a configuration of input settings for manufacturing a product, based on a causal model that measures causal relationships between input settings and a measure of a quality of the product; ii) determining the measure of the quality of the product manufactured using the configuration of input settings; and iii) adjusting, based on the measure of the quality of the product manufactured using the configuration of input settings, the causal model.