The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 12, 2024
Filed:
Dec. 17, 2021
Rohde & Schwarz Gmbh & Co. KG, Munich, DE;
Andrew Schaefer, Munich, DE;
Rohde & Schwarz GmbH & Co. KG, Munich, DE;
Abstract
A measurement instrument for testing a device under test is described. The device under test has at least two test points. The measurement instrument includes a first measurement channel, a second measurement channel, and a machine-learning circuit. The first measurement channel is configured to process a first input signal associated with one of the at least two test points, thereby generating a first measurement signal. The second measurement channel is configured to process a second input signal associated with another one of the at least two test points, thereby generating a second measurement signal. The machine-learning circuit is configured to determine at least one correlation quantity based on the first measurement signal and based on the second measurement signal, wherein the at least one correlation quantity is indicative of a correlation between the first measurement signal and the second measurement signal. Further, a measurement system and a signal processing method are described.