The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 12, 2024

Filed:

May. 12, 2021
Applicant:

Shimadzu Corporation, Kyoto, JP;

Inventors:

Takayuki Nakatani, Kyoto, JP;

Yugo Hase, Kyoto, JP;

Tomohiro Kawase, Kyoto, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 35/00 (2006.01); G01N 30/02 (2006.01); G06F 9/50 (2006.01); G06Q 10/0631 (2023.01); H01J 49/26 (2006.01);
U.S. Cl.
CPC ...
G01N 35/0092 (2013.01); G06F 9/5027 (2013.01); G01N 30/02 (2013.01); G01N 2030/025 (2013.01); G01N 2030/027 (2013.01); G06Q 10/06312 (2013.01); H01J 49/26 (2013.01);
Abstract

Device information representing a configuration of each analysis device is acquired by a device information acquirer. Schedule information representing a use schedule of each analysis device is acquired by a schedule information acquirer. A sample analysis method is acquired by an analysis method acquirer. An analysis device that is fitted to the analysis method acquired by the analysis method acquirer and is usable is selected by a device selector from among a plurality of analysis devices based on the device information acquired by the device information acquirer and the schedule information acquired by the schedule information acquirer. Identification information for identifying the analysis device selected by the device selector is presented by a presenter.


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