The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 12, 2024
Filed:
Apr. 09, 2020
Rosen Swiss Ag, Stans, CH;
Andrey Danilov, Stans, CH;
Matthias Peussner, Westerkappeln, DE;
ROSEN Swiss AG, Stans, CH;
Abstract
A method is provided for determining the geometry of a metallic object, with in particular one or more real, examined defects, with a reference data set of the object generated on the basis of at least one measurement by at least one non-destructive measuring method, preferably comprising an at least partial representation of the object on or by an at least three-dimensional object grid by means of a computer unit. A classification of anomaly-free areas and anomaly-affected areas of the object is performed on the basis of at least parts of the at least one reference data set. An initial object grid is created, a prediction data set of the at least one non-destructive measurement method is calculated by a simulation routine using the initial object grid, at least parts of the prediction data set are compared with at least parts of the at least one reference data set, excluding the anomaly-afflicted regions, and the initial object grid is used as an object grid describing the geometry of the object as a function of at least one accuracy measure, or the initial object grid is iteratively adapted to the geometry of the object in the anomaly-free regions by means of the EDP unit.