The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 12, 2024
Filed:
Feb. 16, 2021
Mitsubishi Heavy Industries, Ltd., Tokyo, JP;
MITSUBISHI HEAVY INDUSTRIES, LTD., Tokyo, JP;
Abstract
A defect detection method includes: a step of irradiating an object with a pulsed laser beam to continuously generate ultrasonic waves in the object; and a step of detecting the presence or absence of an internal defect of the object on the basis of the presence or absence of resonance of the ultrasonic waves occurring between a surface of the object and the internal defect. In this method, the internal defect is detected on the basis of the presence or absence of resonance of the ultrasonic waves occurring between the surface of the object and the internal defect. The internal defect can be thus detected even when the internal defect is in a surface layer of the object. The detected internal defect is crack or void.