The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 12, 2024
Filed:
Jul. 20, 2021
Applicant:
Gist (Gwangju Institute of Science and Technology), Gwangju, KR;
Inventors:
Sung Yang, Gwangju, KR;
Taek Eon Jeong, Busan, KR;
Jae Hyeon Ahn, Busan, KR;
Yu Gyung Jung, Busan, KR;
Assignee:
GIST(Gwangju Institute of Science and Technology), Gwangju, KR;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 27/447 (2006.01);
U.S. Cl.
CPC ...
G01N 27/44786 (2013.01); B03C 5/005 (2013.01); G01N 27/44791 (2013.01); B01L 3/5027 (2013.01);
Abstract
The present disclosure relates to a microorganism detection apparatus using a dielectrophoresis (DEP) force. A microorganism detection apparatus according to one embodiment of the present disclosure may include a detection unit that detects microbial particles using a DEP force corresponding to latex particles combined with the microbial particles.