The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 12, 2024
Filed:
Jun. 28, 2021
Applicant:
Konica Minolta, Inc., Tokyo, JP;
Inventor:
Sumiya Nagatsuka, Hino, JP;
Assignee:
KONICA MINOLTA, INC., Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 23/04 (2018.01); A61B 6/00 (2006.01); G06T 7/00 (2017.01); A61B 6/58 (2024.01);
U.S. Cl.
CPC ...
G01N 23/04 (2013.01); A61B 6/54 (2013.01); G06T 7/0012 (2013.01); A61B 6/583 (2013.01); G01N 2223/3035 (2013.01); G01N 2223/401 (2013.01); G06T 2207/10116 (2013.01); G06T 2207/30168 (2013.01);
Abstract
Provided is a dynamic imaging quality control device that performs quality control concerning dynamic imaging in which dynamics of a subject is imaged by sequential radiation emissions to the subject. The dynamic imaging quality control device includes a hardware processor. The hardware processor presents information on the quality control. The information on the quality control includes at least one of information on a framerate, information on a system sensitivity, and information on an image region.
Nagatsuka, Sumiya. (2024). Dynamic imaging quality control device, storage medium, and dynamic imaging quality control method (U.S. Patent No. 12140552). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12140552
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