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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 12140525 B1

PDFFull Text
Date of Patent:
Nov. 12, 2024

Filed:

Mar. 22, 2021

Measuring device and imaging control method

Applicant:

Sony Group Corporation, Tokyo, JP;

Inventors:

Susumu Takatsuka, Tokyo, JP;

Hiroki Tetsukawa, Tokyo, JP;

Assignee:

SONY GROUP CORPORATION, Tokyo, JP;

Attorney:

XSENSUS LLP

Primary Examiner:

Samuel D Fereja

Int. Cl.
CPC ...
G06V 10/25 (2022.01); G01N 15/14 (2006.01); G01N 15/1433 (2024.01); G06T 7/73 (2017.01); G06V 10/60 (2022.01); G06V 10/75 (2022.01); G06V 20/69 (2022.01); H04N 23/56 (2023.01); H04N 23/60 (2023.01); G01N 15/00 (2006.01); G01N 15/01 (2024.01);
U.S. Cl.
CPC ...
G01N 15/1433 (2024.01); G01N 15/147 (2013.01); G06T 7/74 (2017.01); G06V 10/25 (2022.01); G06V 10/60 (2022.01); G06V 10/751 (2022.01); G06V 20/698 (2022.01); H04N 23/56 (2023.01); H04N 23/60 (2023.01); G01N 2015/0053 (2013.01); G01N 15/01 (2024.01); G06V 2201/07 (2022.01);
Abstract

A measuring device according to the present technology includes a light emitting unit configured to emit light to a fluid, a light receiving unit configured to perform photoelectric conversion for incident light using an electron avalanche phenomenon by a plurality of pixels to obtain a light reception signal, and a control unit configured to perform processing of detecting a target object in the fluid on the basis of the light reception signal and execute an imaging operation of the target object on condition that the target object is detected.

Find Patent Forward Citations

Takatsuka, Susumu. (2024). Measuring device and imaging control method (U.S. Patent No. 12140525). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12140525

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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