The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 12, 2024
Filed:
Jul. 27, 2022
Samsung Electronics Co., Ltd., Suwon-si, KR;
Deokhyeon Kwon, Hwaseong-si, KR;
Jua Ryu, Seongnam-si, KR;
Juhyun Park, Seoul, KR;
Kidoo Kim, Hwaseong-si, KR;
Hyunok Kim, Suwon-si, KR;
Sunah Park, Hwaseong-si, KR;
Hyunjung Choi, Hwaseong-si, KR;
SAMSUNG ELECTRONICS CO., LTD., Suwon-si, KR;
Abstract
In an optical measurement method, light is directed from a light generator to a light path cell. A light path is generated by continuously reflecting the light between first and second high reflection mirrors within a light path cell that face to each other. An optical signal is detected from an aerosol sample present within a range of the light path. The optical signal is separated into a particle signal and a gas signal by using a statistical methodology. A particle concentration is calculated from the particle signal by using an assumption of an optical particle counter (OPC). A gas concentration is calculated from the gas signal by using optical characteristic data of gas.