The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 12, 2024

Filed:

Dec. 25, 2019
Applicant:

Carl Zeiss Industrielle Messtechnik Gmbh, Oberkochen, DE;

Inventors:

Volker Greifzu, Oberkochen, DE;

Uwe Holz, Essingen, DE;

Nils Haverkamp, Aalen, DE;

Ulrike Zeiser, Nattheim, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 11/00 (2006.01); G01B 7/008 (2006.01); G01B 21/04 (2006.01);
U.S. Cl.
CPC ...
G01B 11/005 (2013.01); G01B 7/008 (2013.01); G01B 21/042 (2013.01);
Abstract

A standard for calibrating a coordinate measuring machine includes a main body with a permanent calibration structure. The calibration structure includes a first arrangement. The first arrangement is configured in such a way that three axes of a projection of the first arrangement on a plane, the axes intersecting at a common point, each run over an identically configured first portion. The first portions are each delimited by the common point on one side. The identically configured first portions each have n zones. Directly adjacent zones differ in one optical property. In various implementations, n is greater than or equal to 3.


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