The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 12, 2024

Filed:

Dec. 18, 2023
Applicant:

Apple Inc., Cupertino, CA (US);

Inventors:

Mark Alan Arbore, Los Altos, CA (US);

Matthew A. Terrel, Campbell, CA (US);

Assignee:

APPLE INC., Cupertino, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 27/48 (2006.01); F21V 3/00 (2015.01); F21V 5/00 (2018.01); F21V 5/04 (2006.01); F21V 14/00 (2018.01); G01N 21/01 (2006.01); G02B 5/02 (2006.01); G02B 19/00 (2006.01); G02B 27/30 (2006.01);
U.S. Cl.
CPC ...
F21V 14/00 (2013.01); F21V 3/00 (2013.01); F21V 5/007 (2013.01); F21V 5/043 (2013.01); G02B 19/0057 (2013.01); G02B 27/30 (2013.01); G02B 27/48 (2013.01); G01N 21/01 (2013.01);
Abstract

Configurations for a photonics assembly design and methods for mitigating coherent noise thereof are disclosed. The photonics assembly may include a set of light sources, an optical subsystem that may include a set of optical elements, and a diffusing element. The light emitted by the set of light sources may be different wavelengths and the light may be de-cohered by a phase shifter before being received by the set of optical elements. The diffusing element may be moveable and may be capable of repeating the same positions or set of positions for each beam of light emitted by the set of light sources. By combining the coherent noise mitigation techniques of the moveable diffusing element and the de-cohered light, the photonics system may provide an illumination profile with a specific spatial profile and angular profile on the sample that allows reliable measurement of the sample and coherent noise mitigation.


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