The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 12, 2024
Filed:
Jan. 19, 2021
Baidu Usa Llc, Sunnyvale, CA (US);
Shu Jiang, Sunnyvale, CA (US);
Yu Cao, Sunnyvale, CA (US);
Qi Luo, Sunnyvale, CA (US);
Yu Wang, Sunnyvale, CA (US);
Weiman Lin, Sunnyvale, CA (US);
Longtao Lin, Sunnyvale, CA (US);
Jinghao Miao, Sunnyvale, CA (US);
BAIDU USA LLC, Sunnyvale, CA (US);
Abstract
Disclosed are performance metrics for evaluating the accuracy of a dynamic model in predicting the trajectory of ADV when simulating the behavior of the ADV under the control commands. The performance metrics may indicate the degree of similarity between the predicted trajectory of the dynamic model and the actual trajectory of the vehicle when applied with identical control commands. The performance metrics measure deviations of the predicted trajectory of the dynamic model from the actual trajectory based on the ground truths. The performance metrics may include cumulative or mean absolute trajectory error, end-pose difference (ED), two-sigma defect rate (ε), the Hausdirff Distance (HAU), the longest common sub-sequence error (LCSS), or dynamic time warping (DTW). The two-sigma defect rate represents the ratio of the number of points with true location error falling out of the 2σ range of the predicted location error over the total number of points in the trajectory.