The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 12, 2024

Filed:

Jun. 21, 2023
Applicant:

General Electric Company, Schenectady, NY (US);

Inventor:

Scott Alan Gold, Waynesville, OH (US);

Assignee:

General Electric Company, Evendale, OH (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B23K 15/00 (2006.01); B23K 15/02 (2006.01); B33Y 30/00 (2015.01); B33Y 50/02 (2015.01); G01N 29/12 (2006.01); G01N 29/24 (2006.01);
U.S. Cl.
CPC ...
B23K 15/0086 (2013.01); B23K 15/0013 (2013.01); B23K 15/002 (2013.01); B23K 15/0026 (2013.01); B23K 15/02 (2013.01); B33Y 30/00 (2014.12); B33Y 50/02 (2014.12); G01N 29/12 (2013.01); G01N 29/2437 (2013.01); G01N 29/2443 (2013.01); G01N 2291/0289 (2013.01);
Abstract

Devices, systems, methods, and kits of parts for monitoring operation of an electron beam additive manufacturing systems are disclosed. A monitoring system includes one or more measuring devices positioned on the at least one wall in the interior of a build chamber of the additive manufacturing system. Each one of the one or more measuring devices includes a piezoelectric crystal. The monitoring system further includes an analysis component communicatively coupled to the one or more measuring devices. The analysis component is programmed to receive information pertaining to a frequency of oscillation of the piezoelectric crystal. A collection of material on the one or more measuring devices during formation of an article within the build chamber causes a change to the frequency of oscillation of the piezoelectric crystal that is detectable by the analysis component and usable to determine a potential build anomaly of the article.


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