The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 12, 2024
Filed:
Jan. 07, 2019
Applicant:
Sony Corporation, Tokyo, JP;
Inventors:
Assignee:
Sony Corporation, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B01L 3/00 (2006.01); G01N 15/14 (2006.01); G01N 15/149 (2024.01);
U.S. Cl.
CPC ...
B01L 3/502761 (2013.01); B01L 3/502746 (2013.01); G01N 15/1484 (2013.01); B01L 2200/0652 (2013.01); B01L 2200/14 (2013.01); B01L 2300/0816 (2013.01); B01L 2300/0864 (2013.01); B01L 2400/049 (2013.01); G01N 15/149 (2024.01);
Abstract
A method of extracting microparticles by detecting target microparticles for extraction in a main flow path which communicates with a pressure chamber, generating for each of the detected target microparticles a change in a negative pressure in the pressure chamber communicating with the main flow path to separate and extract each of the detected target microparticles flowing in the main flow path into the pressure chamber, wherein generating the change of the negative pressure to extract the detected target microparticles comprises generating a negative change in pressure by a different amount in accordance with a separation between the detected target microparticles.