The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 12, 2024

Filed:

May. 05, 2022
Applicant:

Fujifilm Sonosite, Inc., Bothell, WA (US);

Inventors:

Saeed Aliakbari, Snohomish, WA (US);

Andrew Lundberg, Woodinville, WA (US);

Davinder S. Dhatt, Woodinville, WA (US);

Thomas Endres, Sagle, ID (US);

Assignee:

FUJIFILM SONOSITE, INC., Bothell, WA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 8/08 (2006.01); A61B 8/00 (2006.01); G01R 31/00 (2006.01);
U.S. Cl.
CPC ...
A61B 8/5269 (2013.01); A61B 8/54 (2013.01); G01R 31/001 (2013.01);
Abstract

Systems and methods to detect electromagnetic (EM) emissions on ultrasound systems are described. In some embodiments, an ultrasound system includes an ultrasound scanner that is configured to generate ultrasound data based on reflections of ultrasound signals transmitted by the ultrasound scanner. An ultrasound machine is coupled to the ultrasound scanner and configured to generate an ultrasound image based on the ultrasound data. A circuit is coupled to the ultrasound machine and configured to make a determination whether the ultrasound image is corrupted by a noise process.


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