The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 12, 2024
Filed:
May. 10, 2024
Siemens Healthineers Ag, Forchheim, DE;
Richard Obler, Erlangen, DE;
Philipp Bernhardt, Forchheim, DE;
Siemens Healthineers AG, Forchheim, DE;
Abstract
A method for operating an X-ray imaging system includes outputting first X-ray beams onto an X-ray detector by an X-ray source for acquisition of a first X-ray capture of an object under examination. The object under examination is arranged between the X-ray source and the X-ray detector and is passed through by the first X-ray beams. The X-ray detector acquires an entry dose of the first X-ray beams after passage through the object under examination. A parameter value of at least one parameter for output of second X-ray beams by the X-ray source for acquisition of a second X-ray capture of the object under examination is ascertained by a control system. The parameter value is ascertained by the control system according to a specified ascertainment method as a function of a foreground substance of a foreground object, a background substance of a background object, and the entry dose.