The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 05, 2024

Filed:

Jun. 15, 2023
Applicant:

Qualcomm Incorporated, San Diego, CA (US);

Inventors:

Kanchan Kumar Gorain, Somerset, NJ (US);

Raja Sekhar Bachu, Kendall Park, NJ (US);

Assignee:

QUALCOMM Incorporated, San Diego, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04W 72/08 (2009.01); H04L 27/26 (2006.01); H04W 72/0446 (2023.01); H04W 72/0453 (2023.01); H04W 74/0833 (2024.01);
U.S. Cl.
CPC ...
H04W 74/0833 (2013.01); H04L 27/2607 (2013.01); H04L 27/2636 (2013.01); H04W 72/0446 (2013.01); H04W 72/0453 (2013.01);
Abstract

An O-RU may receive a PRACH preamble and a PUSCH within a plurality of symbols of a slot, the PRACH and the PUSCH having different numerology. The O-RU may filter a PUSCH CP for each symbol of the PRACH preamble through a FFT window per symbol of the PRACH preamble, the FFT window extending from the end of the PUSCH CP within a symbol to the end of the symbol, and perform FFT per the FFT window of each symbol of the PRACH preamble. The O-RU may extract I/Q data in frequency domain corresponding to the PRACH preamble, adjust phase shift of the extracted I/Q data to generate the I/Q data of the PRACH preamble accounting for shift of the each FFT window in time domain compared to FFT windows of PRACH CP filtered PRACH preamble and send the I/Q data of the PRACH preamble to an O-DU.


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