The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 05, 2024
Filed:
Sep. 27, 2019
Nec Corporation, Tokyo, JP;
Hirofumi Ueda, Tokyo, JP;
Yoshinobu Ohta, Tokyo, JP;
Tomohiko Yagyu, Tokyo, JP;
Norio Yamagaki, Tokyo, JP;
NEC CORPORATION, Tokyo, JP;
Abstract
Provided is an analysis system that can analyze the degree of impact of vulnerability on individual systems. An analysis unitgenerates an attack pattern that includes an attack condition, an attack result, an attack means that is vulnerability that is used by an attack, and a segment where the attack can occur in a system to be diagnosed. A calculation unitcalculates an evaluation value, for each vulnerability, which indicates degree of impact of the vulnerability on the system to be diagnosed. Specifically, the calculation unitcalculates the evaluation value, for each vulnerability, based on the number of the attack patterns that include the vulnerability focused on as the attack means and the number of the segments indicated by each attack pattern that includes the vulnerability focused on as the attack means.