The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 05, 2024

Filed:

Sep. 09, 2022
Applicant:

17live Japan Inc., Tokyo, JP;

Inventors:

Li-Han Chen, Taipei, TW;

Jin-Wei Liu, Taipei, TW;

Yi-Hsiung Chen, Taipei, TW;

Yung-Chi Hsu, Taipei, TW;

Assignee:

17LIVE JAPAN INC., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04L 41/16 (2022.01); H04L 41/147 (2022.01); H04L 43/0852 (2022.01);
U.S. Cl.
CPC ...
H04L 41/16 (2013.01); H04L 41/147 (2013.01); H04L 43/0852 (2013.01);
Abstract

The present disclosure relates to a system, a method and a computer-readable medium for quality prediction. The method includes obtaining values of a parameter of a first endpoint, obtaining values of a parameter of a second endpoint, and generating a prediction of the parameter of the first endpoint according to the values of the parameter of the first endpoint and the values of the parameter of the second endpoint. The prediction includes probability distribution information of the parameter of the first endpoint at a timing in the future. The present disclosure can result in a more precise quality prediction.


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