The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 05, 2024

Filed:

Jun. 17, 2020
Applicants:

Nec Corporation, Tokyo, JP;

Kyushu University, National University Corporation, Fukuoka, JP;

Inventors:

Takashi Shibata, Tokyo, JP;

Hiroyoshi Miyano, Tokyo, JP;

Eiji Kaneko, Tokyo, JP;

Masato Toda, Tokyo, JP;

Tsubasa Minematsu, Fukuoka, JP;

Atsushi Shimada, Fukuoka, JP;

Rin-Ichiro Taniguchi, Fukuoka, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06V 10/774 (2022.01); G06V 10/22 (2022.01); G06V 10/762 (2022.01); G06V 10/764 (2022.01); G06V 20/70 (2022.01);
U.S. Cl.
CPC ...
G06V 10/7753 (2022.01); G06V 10/22 (2022.01); G06V 10/762 (2022.01); G06V 10/764 (2022.01); G06V 20/70 (2022.01); G06V 2201/07 (2022.01);
Abstract

A learning apparatus () according to the present invention includes a detection unit () that detects, as a candidate region of a learning target, a region detected by one of first detection processing of detecting an object region from a predetermined image and second detection processing of detecting a change region from background image information and the image, and not detected by the other, an output unit () that outputs at least a part of the candidate region as a labeling target, and a learning unit () that learns a model for performing the first detection processing or a model for performing the second detection processing by using the labeled candidate region as learning data.


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