The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 05, 2024
Filed:
Feb. 18, 2022
Kabushiki Kaisha Toshiba, Tokyo, JP;
Nobukatsu Sugiyama, Kawasaki Kanagawa, JP;
Junichiro Ooga, Kawasaki Kanagawa, JP;
Yoshiyuki Ishihara, Kawasaki Kanagawa, JP;
Junji Oaki, Kawasaki Kanagawa, JP;
Hiroshi Ohno, Tokyo, JP;
Hideaki Okano, Yokohama Kanagawa, JP;
Hiroya Kano, Kawasaki Kanagawa, JP;
Takahiro Kamikawa, Tokyo, JP;
Kabushiki Kaisha Toshiba, Tokyo, JP;
Abstract
In an embodiment, a processing device relating to an inspection of an inspection object by a photography unit is provided. A processor of the processing device calculates a plurality of photography points as positions photographing the inspection object based on shape data in which a shape of a surface of the inspection object is indicated by a point group, and information relating to a position and a normal vector on the surface of the inspection object is defined by the point group. The processor executes analysis regarding a path that passes through all of the calculated photography points and minimizes a sum of a movement cost from each of the photography points to a photography point of a next movement destination, and calculates a path corresponding to an analysis result as a path for moving the photography unit.