The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 05, 2024

Filed:

Jul. 11, 2022
Applicant:

Institute of Automation, Chinese Academy of Sciences, Beijing, CN;

Inventors:

Jie Tian, Beijing, CN;

Peng Zhang, Beijing, CN;

Hui Hui, Beijing, CN;

Yimeng Li, Beijing, CN;

Lin Yin, Beijing, CN;

Xin Feng, Beijing, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 11/00 (2006.01); A61B 5/00 (2006.01); A61B 5/0515 (2021.01);
U.S. Cl.
CPC ...
G06T 11/006 (2013.01); A61B 5/0515 (2013.01); A61B 5/7257 (2013.01);
Abstract

The present disclosure includes: transforming a time-domain voltage signal collected by an MPI system device to a frequency domain; calculating a square root of a square sum of a real part and an imaginary part at each frequency point of a frequency domain signal; arranging acquired amplitudes in a descending order, and acquiring a screening threshold by an amplitude ratio method; screening an amplitude through the screening threshold and constructing frequency domain signal data; acquiring a row vector of a system matrix corresponding to each frequency point of the data, so as to construct an update system matrix; and solving, based on the frequency domain signal array and the update system matrix, an inverse problem in a form of a least square based on an L2 constraint to obtain a three-dimensional magnetic particle concentration distribution result, so as to achieve a fast reconstruction of the MPI system.


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