The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 05, 2024
Filed:
Dec. 04, 2023
Applicant:
Cape Analytics, Inc., Palo Alto, CA (US);
Inventors:
Kyler J. Brown, Palo Alto, CA (US);
Sarah Cebulski, Palo Alto, CA (US);
Assignee:
Cape Analytics, Inc., Palo Alto, CA (US);
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06Q 40/08 (2012.01); G06T 7/00 (2017.01); G06T 7/11 (2017.01); G06V 10/26 (2022.01); G06V 10/75 (2022.01); G06V 10/82 (2022.01); G06V 20/00 (2022.01); G06V 20/10 (2022.01);
U.S. Cl.
CPC ...
G06Q 40/08 (2013.01); G06T 7/0002 (2013.01); G06T 7/11 (2017.01); G06V 10/26 (2022.01); G06V 10/751 (2022.01); G06V 10/82 (2022.01); G06V 20/176 (2022.01); G06V 20/39 (2022.01); G06T 2207/10024 (2013.01); G06T 2207/20081 (2013.01); G06T 2207/20084 (2013.01); G06T 2207/30184 (2013.01);
Abstract
In variants, the method for property condition analysis can include: determining a measurement, optionally determining a set of property attributes, determining a condition score, optionally providing the condition score, and optionally training a condition scoring model.