The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 05, 2024
Filed:
Jun. 28, 2021
Siemens Healthineers International Ag, Steinhausen, CH;
Daren Sawkey, Palo Alto, CA (US);
SIEMENS HEALTHINEERS INTERNATIONAL AG, Steinhausen, CH;
Abstract
A localized evaluation network incorporates a discriminator acting as classifier, which may be included within a generative adversarial network (GAN). GAN may include a generative network such as U-NET for creating segmentations. The localized evaluation network is trained on image pairs including medical images of organs of interest and segmentation (mask) images. The network is trained to distinguish whether an image pair does or does not represent the ground truth. GAN examines interior layers of the discriminator and evaluates how much each localized image region contributes to the final classification. The discriminator may analyze regions of the image pair that contribute to a classification by analyzing layer weights of the machine learning model. Disclosed embodiments include a visual attribute, such as a heat map, that represents contributions of localized regions of a contour to an overall confidence score. These localized regions may be highlighted and reported for quality assurance review.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile