The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 05, 2024
Filed:
Dec. 02, 2019
Leica Geosystems Ag, Heerbrugg, CH;
Gregory Walsh, Walnut Creek, CA (US);
Roman Parys, Rebstein, CH;
Alexander Velizhev, Gallen, CH;
Bernhard Metzler, Dornbirn, AT;
LEICA GEOSYSTEMS AG, Heerbrugg, CH;
Abstract
A method may include identifying features in images of a setting captured by cameras associated with a laser scanner at a first location. The features may correspond to elements in the setting. The method may include correlating the features with scan point data associated with the elements. The scan point data may be derived from a scan of the setting by a laser of the laser scanner at the first location. The method may include tracking the features within images captured by the cameras. The images may be captured during movement of the laser scanner away from the first location. The method may include estimating a position and/or an orientation of the laser scanner at a second location based on the tracking of the features and based on the correlating of the features with the scan point data.