The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 05, 2024

Filed:

Aug. 24, 2022
Applicant:

Mellanox Technologies, Ltd., Yokneam Illit, IL;

Inventors:

Barak Freedman, Binyamina, IL;

Amir Silber, Rehovot, IL;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/28 (2006.01); G01B 11/24 (2006.01); G01N 21/95 (2006.01); G06T 7/00 (2017.01); G06T 7/62 (2017.01);
U.S. Cl.
CPC ...
G01R 31/2886 (2013.01); G01B 11/24 (2013.01); G01N 21/9501 (2013.01); G06T 7/0004 (2013.01); G06T 7/62 (2017.01); G06T 2200/04 (2013.01); G06T 2207/30148 (2013.01);
Abstract

A substrate testing device includes a first testing component configured to couple to electrical pads of a substrate and perform electrical testing on one or more dies of the substrate during a test. The substrate testing device includes a second testing component configured to perform optical testing of the one or more dies during the test. The substrate testing device further includes a third testing component comprising a three-dimensional scanner configured to perform a dimensional scan of the one or more dies of the substrate, wherein the third testing component is to perform geometrical testing on the one or more dies during the test.


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