The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 05, 2024

Filed:

Oct. 06, 2020
Applicant:

The Board of Trustees of the Leland Stanford Junior University, Stanford, CA (US);

Inventors:

Garry P. Nolan, Redwood City, CA (US);

Sean C. Bendall, San Mateo, CA (US);

Robert M. Angelo, Menlo Park, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01N 33/483 (2006.01); G01N 23/2258 (2018.01); G01N 33/50 (2006.01); G01N 33/68 (2006.01); H01J 49/00 (2006.01); H01J 49/14 (2006.01);
U.S. Cl.
CPC ...
G01N 23/2258 (2013.01); G01N 33/4833 (2013.01); G01N 33/5005 (2013.01); G01N 33/5008 (2013.01); G01N 33/6848 (2013.01); H01J 49/0036 (2013.01); H01J 49/14 (2013.01); G01N 2458/15 (2013.01); H01J 49/142 (2013.01);
Abstract

A method of analyzing a population of cells is disclosed. In certain embodiments, the method includes i) obtaining an array of cells on a substrate, wherein the cells are labeled with one or more mass tags and are separated from one another, ii) measuring, using secondary ion mass spectrometry (SIMS), the abundance of the one or more mass tags at a plurality of locations occupied by the cells, thereby generating, for each individual cell measured, a set of data, and iii) outputting the set of data for each of the cells analyzed. Also provided herein are systems that find use in performing the subject method. In some embodiments, the system is an automated system for analyzing a population of cells using SIMS.


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