The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 05, 2024
Filed:
Oct. 15, 2020
Applicant:
Shimadzu Corporation, Kyoto, JP;
Inventors:
Takuro Izumi, Kyoto, JP;
Tetsuya Yoneda, Kyoto, JP;
Assignee:
SHIMADZU CORPORATION, Kyoto, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 23/20008 (2018.01); G01N 23/207 (2018.01); G01N 23/2209 (2018.01); G01N 23/223 (2006.01);
U.S. Cl.
CPC ...
G01N 23/20008 (2013.01); G01N 23/2076 (2013.01); G01N 23/2209 (2018.02); G01N 23/223 (2013.01); G01N 2223/076 (2013.01); G01N 2223/079 (2013.01); G01N 2223/1016 (2013.01); G01N 2223/3103 (2013.01); G01N 2223/3106 (2013.01);
Abstract
An X-ray fluorescence analyzer is provided inside an analysis chamber covered with a housing with: an X-ray tube; an analyzing crystal for spectrally dispersing X-ray fluorescence emitted from a sample; an X-ray detector for detecting the X-ray fluorescence spectrally dispersed by the analyzing crystal; a warm air generator for generating warm air to maintain a temperature of the analyzing crystal at a target temperature; and a Peltier element for cooling the X-ray detector.