The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 05, 2024
Filed:
Oct. 19, 2021
University of Florida Research Foundation, Inc., Gainesville, FL (US);
United States of America As Represented BY the Administrator of Nasa, Washington, DC (US);
Nevin B. Brosius, Gainesville, FL (US);
Ranganathan Narayanan, Gainesville, FL (US);
Michael P. SanSoucie, Huntsville, AL (US);
UNIVERSITY OF FLORIDA RESEARCH FOUNDATION, INCORPORATED, Gainesville, FL (US);
UNITED STATES OF AMERICA AS REPRESENTED BY THE ADMINISTRATOR OF NASA, Washington, DC (US);
Abstract
Various examples are provided related to measuring surface tension. In one example, a method includes levitating a sample using electrostatic levitation; applying a signal to at least one electrode to excite the sample into a n=3 mode of oscillation; capturing images of the sample with a respective image being associated with a particular frequency that is applied to the sample when the respective image is captured; quantifying sample resonance using a projection method of Legendre polynomials based on the plurality of images; and determining a measured resonance frequency of the sample by an analysis of the sample resonance. The sample can be levitated using a feedback-controlled voltage and the applied signal can be swept over a range of frequencies. A system including electrodes, a position sensor, a camera device, and at least one computing device can be used to carry out the method.