The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 05, 2024
Filed:
Jul. 13, 2021
Applicant:
Ngk Insulators, Ltd., Nagoya, JP;
Inventors:
Makoto Miyahara, Tajimi, JP;
Kenichi Noda, Nagoya, JP;
Assignee:
NGK INSULATORS, LTD., Nagoya, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C01B 37/04 (2006.01); B01D 53/22 (2006.01); B01D 69/12 (2006.01); B01D 69/14 (2006.01); B01D 71/02 (2006.01); B01J 20/02 (2006.01); B01J 20/18 (2006.01); B01J 20/28 (2006.01); C01B 37/06 (2006.01); C01B 37/08 (2006.01);
U.S. Cl.
CPC ...
C01B 37/04 (2013.01); B01D 69/1213 (2022.08); B01D 69/147 (2013.01); B01D 71/0281 (2022.08); B01J 20/0248 (2013.01); B01J 20/0292 (2013.01); B01J 20/18 (2013.01); B01J 20/28035 (2013.01); C01B 37/065 (2013.01); C01B 37/08 (2013.01); B01D 53/228 (2013.01); C01P 2002/72 (2013.01);
Abstract
A crystalline material contains oxygen, aluminum and phosphorus, and has powder X-ray diffraction peaks shown below. When the peak at 2θ=14.17±0.2° is used as the reference peak and the intensity of the reference peak is set to 100, for example, the relative intensity of the peak at 2θ=8.65±0.2° is 1 to 15. The relative intensity of the peak at 2θ=9.99±0.2° is 1 to 15. The relative intensity of the peak at 2θ=16.52±0.2° is 5 to 80. The relative intensity of the peak at 2θ=17.37±0.2° is 1 to 15. The relative intensity of the peak at 2θ=21.81±0.2° is 10 to 80.