The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 05, 2024

Filed:

May. 10, 2019
Applicant:

Board of Regents, the University of Texas System, Austin, TX (US);

Inventors:

Adela Ben-Yakar, Austin, TX (US);

Tianqi Li, Poway, CA (US);

Chris Martin, Austin, TX (US);

Peisen Zhao, Austin, TX (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/00 (2006.01); A61B 5/00 (2006.01); G01N 21/64 (2006.01);
U.S. Cl.
CPC ...
A61B 5/0071 (2013.01); A61B 5/0082 (2013.01); G01N 21/6458 (2013.01); G02B 21/0036 (2013.01); G02B 21/0048 (2013.01); G02B 21/006 (2013.01); G02B 21/0072 (2013.01); G02B 21/0076 (2013.01);
Abstract

Systems and methods for line excitation array detection (LEAD) microscopy. The systems and methods include an excitation beam from an optical beam source and a subject of interest. Light is scanned across the subject of interest and optical signals are detected using a parallel optical detection means. A number of mechanical, acoustic and/or optical components such as scanning mirrors, DMDs, OADs, electric motors may be used separately or in conjunction to aid in the scanning of the excitation beam across the subject of interest.


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