The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 05, 2024
Filed:
Aug. 03, 2021
Applicant:
University of Miami, Miami, FL (US);
Inventor:
Mohamed Abou Shousha, Fort Lauderdale, FL (US);
Assignee:
University of Miami, Miami, FL (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 3/024 (2006.01); A61B 3/02 (2006.01); A61B 3/028 (2006.01); A61B 3/06 (2006.01); G06N 3/02 (2006.01); G16H 50/20 (2018.01); G16H 50/30 (2018.01);
U.S. Cl.
CPC ...
A61B 3/024 (2013.01); A61B 3/022 (2013.01); A61B 3/028 (2013.01); A61B 3/06 (2013.01); G06N 3/02 (2013.01); G16H 50/20 (2018.01); G16H 50/30 (2018.01);
Abstract
Methods and systems for dynamically determining stimuli characteristics for vision defect determination during a vision test. The methods and systems convert the feedback received from the binary suprathreshold test into a feature input that is provided to a prediction model. The prediction model may be trained to predict non-binary characteristics for sets of locations and confidence scores associated with the sets of locations based on feedback indicating binary characteristics under which users see one or more stimuli presented on user interfaces.