The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 29, 2024

Filed:

Aug. 09, 2023
Applicant:

Nec Corporation, Tokyo, JP;

Inventors:

Hui Lam Ong, Singapore, SG;

Satoshi Yamazaki, Singapore, SG;

Hong Yen Ong, Singapore, SG;

Wei Jian Peh, Singapore, SG;

Assignee:

NEC CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 7/18 (2006.01); G06V 10/84 (2022.01); G06V 20/52 (2022.01); G06V 40/16 (2022.01);
U.S. Cl.
CPC ...
H04N 7/181 (2013.01); G06V 10/84 (2022.01); G06V 20/52 (2022.01); G06V 40/16 (2022.01); G06V 40/161 (2022.01); G06V 40/171 (2022.01); G06V 40/172 (2022.01);
Abstract

The method comprising determining a set of coordinates each for two or more appearances of a target subject within a sequence of images, the set of coordinates of the two or more appearances of the target subject defining a first path; determining a set of coordinates each for two or more appearances of a related subject within a sequence of images, the related subject relating to the target subject, the set of coordinates of the two or more appearances of the related subject defining a second path; determining one or more minimum distances between the first path and the second path so as to determine at least a region of interest; determining a timestamp of a first appearance and a timestamp of a last appearance of the target subject; and determining a timestamp of a first appearance and a timestamp of a last appearance of the related subject.


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