The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 29, 2024

Filed:

Nov. 18, 2022
Applicant:

Dell Products L.p., Round Rock, TX (US);

Inventors:

Niharika Karia, Tewksbury, MA (US);

Frederic Meunier, Montreal, CA;

Bina K. Thakkar, Cary, NC (US);

Assignee:

Dell Products L.P., Round Rock, TX (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H04L 12/24 (2006.01); H04L 41/147 (2022.01); H04L 43/0876 (2022.01);
U.S. Cl.
CPC ...
H04L 43/0876 (2013.01); H04L 41/147 (2013.01);
Abstract

A system, method, and computer-readable medium for performing a data center management and monitoring operation. The data center management and monitoring operation includes: receiving utilization information from a plurality of data center assets within a data center; assigning a load index to each of the plurality of data center assets based upon the utilization information; training a machine learning model to generate a predicted load index for each of the plurality of data center assets; and, presenting the predicted load index for each of the plurality of data center assets to a user.


Find Patent Forward Citations

Karia, Niharika. (2024). Unified performance metric for identifying data center utilization (U.S. Patent No. 12132632). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12132632

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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