The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 29, 2024
Filed:
Jul. 19, 2022
Applicant:
Ciena Corporation, Hanover, MD (US);
Inventors:
Alex W. MacKay, Ottawa, CA;
Andrew D. Shiner, Ottawa, CA;
Yinqing Pei, Kanata, CA;
David W. Boertjes, Nepean, CA;
Fangyuan Zhang, Kanata, CA;
Assignee:
Ciena Corporation, Hanover, MD (US);
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H04B 10/079 (2013.01); H04Q 11/00 (2006.01);
U.S. Cl.
CPC ...
H04B 10/07955 (2013.01); H04B 10/07953 (2013.01); H04Q 11/0066 (2013.01); H04Q 2011/0083 (2013.01);
Abstract
Systems and methods of optimizing launch power for each span in an optical system with a plurality of spans are provided. In an embodiment, a method includes varying power on a span under test of the plurality of spans; observing performance measurements related to of one or more channels, at corresponding optical receivers; and one of setting launch power for the span under test and repeating the varying and observing, responsive to the observed measurements.