The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 29, 2024

Filed:

Jun. 01, 2021
Applicant:

Amp Robotics Corporation, Louisville, CO (US);

Inventors:

Matanya B. Horowitz, Golden, CO (US);

James A. Bailey, Boulder, CO (US);

Assignee:

AMP Robotics Corporation, Louisville, CO (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01); G06F 18/40 (2023.01); G06T 7/70 (2017.01); G06V 10/778 (2022.01); G06V 10/82 (2022.01); G06V 20/52 (2022.01);
U.S. Cl.
CPC ...
G06V 10/82 (2022.01); G06F 18/41 (2023.01); G06T 7/0008 (2013.01); G06T 7/70 (2017.01); G06V 10/7788 (2022.01); G06V 20/52 (2022.01);
Abstract

Systems and methods for optical material characterization of waste materials using machine learning are provided. In one embodiment, a system comprises: an imaging device configured to generate image frames an area and target objects within the area; an object characterization processor coupled to the imaging device and comprising Neural Processing Units and a Neural Network Parameter Set. The Neural Network Parameter Set stores learned parameters utilized by the one or more Neural Processing Units for characterizing the one or more target objects. The Neural Processing Units are configured by the Neural Network Parameter Set to detect a presence of a plurality of different materials within the image frames based on a plurality of different features. For a first image frame of the plurality of image frames, the Neural Processing Units outputs material characterization data that identifies which of the plurality of different materials are detected in the first image frame.


Find Patent Forward Citations

Horowitz, Matanya. (2024). Systems and methods for optical material characterization of waste materials using machine learning (U.S. Patent No. 12131524). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12131524

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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